An inspiring interview at the TechDay
In an interview with Gantner Instruments at TechDay 2026, Michael Tasler shared exciting insights into current customer expectations for measurement and testing technology, as well as the vision behind our products.
What levels of measurement accuracy are important in applications such as e-mobility, NVH, or structure-borne noise measurements?
“The first step is to decide exactly what you want to measure, and then you have to identify what might stand in the way of such a measurement.
Customers rarely focus on bandwidth or sampling rate; rather, the key is ensuring that the overall noise level in the system is appropriate so that important signals aren’t masked by the system’s own noise. What matters, therefore, is the right bandwidth combined with a very low noise level (SNR = signal-to-noise ratio) and the lowest possible signal distortion, so that mathematically meaningful conclusions can be drawn.”
The ADCstamp was recently launched. How did that come about, and what advantages does the module offer?
“To put it simply: measurement technology consists of various components, and when a complete measuring device is needed, the all-in-one packages available on the market not only include the components relevant to measurement but also incorporate memory, FPGAs, USB interfaces, and other elements. Until recently, anyone who needed measurement technology but, for example, didn’t need a USB interface and therefore wanted to develop their own system had to source the components for AD converters on the market and get them up and running. Especially when it comes to isolation for high-voltage applications, things quickly become complicated—and thus time-consuming and costly.
The ADCstamp is therefore a module that offers exactly the measurement technology you need. With the appropriate certifications, the ADCstamp provides fast, direct access to safe and reliable precision measurement technology, thereby eliminating the need for time-consuming in-house development of a high-precision measurement channel.”
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